The MM-16 spectroscopic ellipsometer is an affordable ellipsometer which operates in the visible wavelength range.

The apparatus uses a liquid crystal element to modulate the polarization.The ellipsometer is unique in the respect that it can do a very fast full spectroscopic measurement from which the full 16 - element Mueller matrix can be calculated. This allows for a complete optical characterization of the sample under study. The data obtained through these measurements allows for characterization of layered thin film structures. The apparatus itself is very easy to set up and interfaces smoothly to the computer which runs the sophisticated DeltaPsi2 software package which provides full instrument control and the necessary modelling tools.

The MM-16 is suited for the characterization of thickness and optical constants in the visible range of thin films and multilayer structures:

Dielectrics

Amorphous semiconductors

Polymers

Thin metal films

Glass

The MM-16 provides you with the following benefits:

Liquid crystal modulation ellipsometer

Classical ellipsometric data and the full 16-element Mueller Matrix

Enhanced application capability for the characterization of depolarizing and anisotropic samples

Modular Design

Competitive Price